Keyword: free-electron-laser
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MOP005 FEL Pulse Shortening by Superradiance at FERMI ion, FEL, electron, laser 38
  • N.S. Mirian, L. Giannessi
    Elettra-Sincrotrone Trieste S.C.p.A., Basovizza, Italy
  • S. Spampinati
    Private Address, warrigton, United Kingdom
  Explorations of saturated superradiant regime is one of the methods that could be used to reduce the duration of the pulses delivered by FERMI. Here we present simulation studies that show the possible application of a superradiant cascade leading to a minimum pulse duration below 8 fs and to a peak power exceeding the GW level in both FEL lines FEL-1 and FEL-2.  
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MOP008 Status of the Hard X-Ray Self-Seeding Project at the European XFEL ion, FEL, electron, laser 42
  • G. Geloni, S. Karabekyan, L. Samoylova, S. Serkez, H. Sinn
    XFEL. EU, Hamburg, Germany
  • V.D. Blank, S. Terentiev
    TISNCM, Troitsk, Russia
  • W. Decking, C. Engling, N. Golubeva, V. Kocharyan, B. Krause, S. Lederer, S. Liu, A. Petrov, E. Saldin, T. Wohlenberg
    DESY, Hamburg, Germany
  • X. Dong
    European X-Ray Free-Electron Laser Facility GmbH, Schelefeld, Germany
  • D. Shu
    ANL, Argonne, Illinois, USA
  A Hard X-ray Self-Seeding setup is currently under realization at the European XFEL, and will be ready for installation in 2018. The setup consists of two single-crystal monochromators that will be installed at the SASE2 undulator line. In this contribution, after a short summary of the physical principles and of the design, we will discuss the present status of the project including both electron beam and X-ray optics hardware. We will also briefly discuss the expected performance of the setup, which is expected to produce nearly Fourier-limited pulses of X-ray radiation with increased brightness compared to the baseline of the European XFEL, as well as possible complementary uses of the two electron chicanes.  
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WEP061 Thermal Stress Analysis of a Thin Diamond Crystal Under Repeated Free Electron Laser Heat Load ion, FEL, laser, electron 539
  • J. Wu
    SLAC, Menlo Park, California, USA
  • B. Yang
    University of Texas at Arlington, Arlington, USA
  Funding: The work was supported by the US Department of Energy (DOE) under contract DE-AC02-76SF00515 and the US DOE Office of Science Early Career Research Program grant FWP-2013-SLAC-100164.
Thin crystals are used in many important optical elements, such as monochromator and spectrometer, in XFELs. To function properly, they must survive the ever-increasing heat load under repeated pulses. Here, we conduct a thermal stress analysis to examine the crystal lattice distortion due to the thermal load under various rep rates from 0.1 to 1 MHz. The thermal field is obtained by solving the transient heat transfer equations. The temperature-dependent material properties are used. It is shown that for pulse adsorption energy around tens of microjoule over a spot size of 10 micrometer, the thermal response of diamond is sensitive to rep rate. The thermal strain components are very different in the in- and out-of-plane directions, due to different constraint conditions. It suggests complicated strain effects in the Bragg and Laue diffraction cases.
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