Author: Frei, F.
Paper Title Page
TUP053 The ACHIP Experimental Chambers at PSI 1
  • E. Ferrari, M. Bednarzik, S. Bettoni, S. Borrelli, H.-H. Braun, M. Calvi, Ch. David, M.M. Dehler, F. Frei, T. Garvey, V. Guzenko, N. Hiller, R. Ischebeck, C. Ozkan Loch, E. Prat, J. Raabe, S. Reiche, L. Rivkin, A. Romann, B. Sarafinov, V. Schlott, S. Susmita
    PSI, Villigen PSI, Switzerland
  • E. Ferrari, L. Rivkin
    EPFL, Lausanne, Switzerland
  • P. Hommelhoff
    University of Erlangen-Nuremberg, Erlangen, Germany
  • J.C. McNeur
    Friedrich-Alexander Universität Erlangen-Nuernberg, University Erlangen-Nuernberg LFTE, Erlangen, Germany
  Funding: Gordon and Betty Moore Foundation
The Accelerator on a Chip International Program (ACHIP) is an international collaboration, funded by the Gordon and Betty Moore Foundation, whose goal is to demonstrate that a laser-driven accelerator on a chip can be integrated to fully build an accelerator based on dielectric structures. PSI will provide access to the high brightness electron beam of SwissFEL to test structures, approaches and methods towards achieving the final goal of the project. In this contribution, we will describe the two interaction chambers installed on SwissFEL to perform the proof-of-principle experiments. In particular, we will present the positioning system for the samples, the magnets needed to focus the beam to sub-micrometer dimensions and the diagnostics to measure beam properties at the interaction point.
Saturation of Scintillators in Profile Monitors  
  • R. Ischebeck, E. Ferrari, F. Frei, N. Hiller, G.L. Orlandi, C. Ozkan Loch, V. Schlott
    PSI, Villigen PSI, Switzerland
  SwissFEL uses scintillating screens to measure the transverse profile of the electron beam. These screens, in combination with quadrupole magnets and a transverse deflecting RF structure, are used to measure projected and slice emittance, as well as bunch length. Scintillating screens have been chosen over optical transition radiators because of the coherent transition radiation emitted by the compressed bunches. It is therefore instrumental to characterize the linearity of these monitors in order to ensure reliable measurements. We are presenting here a measurement of saturation effects due to the high charge density in SwissFEL, and describe the results with a numerical model of the process.